“School of Physics”

Back to Papers Home
Back to Papers of School of Physics

Paper   IPM / P / 14145
School of Physics
  Title:   Comment on: [Comment on: Characterization of Microroughness Parameters in Titanium Nitride Thin Films Grown by DC Magnetron Sputtering
1.  A. Gelali
2.  A. Shafiekhani
3.  A. Ghorbani
4.  A. Ahmadpourian
  Status:   Published
  Journal: J. Fusion Energy
  Vol.:  31
  Year:  2012
  Pages:   592
  Supported by:  IPM
Firstly, I appreciate authors of published comment, Solaymani et al. [1], for their attention to our paper. I would like to attract your attention to few points to determine the raised points. Existent mistakes in AFM Images Analysis section (lines 3 and 5) are only typos and should be correct to Rrms and . In page 3 (line 5), DL = N/L is correct. Please see [2] and [3]. In the Eq. 5, Df=8-2. Please see [2, 4, 5]. Since 2D and 3D AFM images in [6] present the better angle of view, I suggest the authors of comment pay more attention to them. I think, they describe the process of fabrication of particles clearly. It is clear that, some typos cannot depreciate the value of paper.

Download TeX format
back to top
scroll left or right