“Papers of School of Physics”
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Surface alignment disorder and thermal Casimir forces in smectic-A liquid crystalline films,
J. Physics: Condens. Matter 32(2020), [abstract]
222. M. Fattahi, N. beryani nezafat, S. Talu, Sh. Solaymani, M. Ghoranneviss, S.M. Elahi, A. Shafiekhani and S. Rezaee,
Topographic characterization of zirconia-based ceramics by atomic force microscopy: A case study on different laser irradiations,
Journal of Alloys and Compounds 831(2020), 154763 [abstract]
223. H. Siampour, S. Abbasian and A. Moshaii,
Copper columnar nanostructures fabricated by glancing angle deposition as a robust and scalable method for high sensitive non-enzymatic glucose detection,
Appl. Surf. Sci. 518(2020), 146182 [abstract]
224. M. Saeedian and A. Zahabi,
Exact solvability and asymptotic aspects of generalized XX0 spin chains,
Physica A: Statistical Mechanics and its Applications 549(2020), 124406 [abstract]
225. M.R. Shabanniya and A. Naji,
Active dipolar spheroids in shear flow and transverse field: Population splitting, cross-stream migration, and orientational pinning,
J. Chem. Phys. 152(2020), 204903 [abstract]
226. A. Soltanmanesh, H.R. Naeij and A. Shafiee,
Can Thermodynamic Behavior of Alice s Particle Affect Bob s Particle,
Scientific Reports 10(2020), 9045 [abstract]
227. H.R. Afshar, H. A. Gonzalez, D. Grumiller and D. Vassilevich,
Flat space holography and the complex Sachdev-Ye-Kitaev model,
Phys. Rev. D 101(2020), 086024 [abstract]
228. S. Talu, A. Achour, Sh. Solaymani, K. Nikpasand, V. Dalouji, A.H. Sari, S. Rezaee and N. B. Nezafat,
Micromorphology analysis of TiO2 thin films by atomic force microscopy images: The influence of postannealing,
Microscopy Research and Technique 83(2020), 457-463 [abstract]
229.
Micromorphology analysis of TiO2 thin films by atomic force microscopy images: The influence of postannealing,
(2020), [abstract]
230. b. Eftekharinia, d. Danaei and a. Dabirian,
Computational study of film morphology impact on light absorption in particulate Ta3N5/Si photoanodes for water splitting,
J. Phys. D: Appl. Phys. 53(2020), [abstract]
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